Post-Issue Patent Quality Control: A Comparative Study of US Patent Re-Examinations and European Patent Oppositions

Graham, Stuart J. H.; Hall, Bronwyn H.; Harhoff, Dietmar; Mowery, David C. (2003). Post-Issue Patent Quality Control: A Comparative Study of US Patent Re-Examinations and European Patent Oppositions in: Wesley M. Cohen, S. A. Merrill (eds.), Patents in the Knowledge-Based Economy 74-119. Washington, D. C.: The National Academic Press.